SNUG Europe was held in the fall this year. There were 327 users in attendance. The conference schedule included 49 User Paper, 23 Tutorials, three Demos and two Panels. The technical content was delivered in 5 parallel tracks over 2 days. This full program allowed users to gain a great deal of knowledge specific to their design area.

The conference received an overall average rating of 3.8 out of 5, the User Papers were well received with an average rating of 3.75, and the Technical rating averaged 3.7.

Thank you to all SNUG authors, technical committee members and attendees!

SNUG Europe 2007 proceedings are available for download at the SNUG Papers Library.

Technical Committee Award
“Small Delay Defect Testing”
By Roberto Mattiuzzo and Saverio Graniello - ST Microelectronics

First Place - Best Paper
"Automated Development of Schematic Documentation for Web-Delivery”
By Kees Timmermans and Simon Meintema - TTA-International

Second Place - Best Paper
"Regression & Random Sims: Techniques & Recommendations”
By Dan Steinberg - Integrated Device Technology (IDT)

Third Place - Best Paper
"Standardizing Verification IP Reuse by Introducing SystemVerilog Verification Components”
By Jacob Andersen, Peter Jensen and Stig Kofoed - SyoSil

 Best First-Time Presenter
"Mix and Match of Flat, Hierarchical And Pseudo-Hierarchical Approaches For Different Steps Of A Design Flow”
By Juergen Dirks - LSI Logic GmbH

Technical Committee - Honorable Mention
“Analog Simulations of High-Speed Serial Chip-to-Chip Links with HSPICE”
Christoph Werner - Nokia Siemens Network and David Sebasti - Texas Instruments Ltd

Technical Committee - Honorable Mention
“Easing the Pain of Sign-off Timing and SI Closure using PrimeTime Distributed Multi-Scenario Analysis”
By Stuart Vernon - Imagination Technologies Ltd.